Emulation General Wiki

GBA Tests: Difference between revisions

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VisualWikitext
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Added GBAHawk results
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{{Outdated}}
This page documents the results of various emulators and hardware using test ROMs. Emulators are tested using the official BIOS. The number next to the fail state is usually the number of tests passed, so higher equals better. Tests for cartridge features like RTC can be undetected in emulators using hash databases.
This page documents the results of various emulators and hardware using test ROMs. Emulators are tested using the official BIOS. The number next to the fail state is usually the number of tests passed, so higher equals better. Tests for cartridge features like RTC can be undetected in emulators using hash databases.


Line 734: Line 732:
|serial_read_data
|serial_read_data
|
|
|Not Tested ||{{Fail}} test 61 ||{{Fail}} test 160 ||{{Pass}} ||{{Pass}} ||{{Fail}} test 160 ||{{Fail}} test 160 ||{{Fail}} test 160 ||Not Tested ||Not Tested
|{{Fail}} test 160 ||{{Fail}} test 61 ||{{Fail}} test 160 ||{{Pass}} ||{{Pass}} ||{{Fail}} test 160 ||{{Fail}} test 160 ||{{Fail}} test 160 ||Not Tested ||Not Tested
|-
|-
!02
!02
|serial_time
|serial_time
|
|
|Not Tested ||{{Fail}} test 143 ||{{Fail}} test 146 ||{{Fail}} test 247 ||{{Fail}} test 131 ||{{Fail}} (stuck) ||{{Fail}} test 146 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|{{Fail}} test 4 ||{{Fail}} test 143 ||{{Fail}} test 146 ||{{Fail}} test 247 ||{{Fail}} test 131 ||{{Fail}} (stuck) ||{{Fail}} test 146 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|-
|-
!03
!03
|serial_time_2
|serial_time_2
|
|
|Not Tested ||{{Fail}} test 144 ||{{Fail}} test 147 ||{{Fail}} test 247 ||{{Fail}} test 133 ||{{Fail}} (stuck) ||{{Fail}} test 148 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|{{Fail}} test 4 ||{{Fail}} test 144 ||{{Fail}} test 147 ||{{Fail}} test 247 ||{{Fail}} test 133 ||{{Fail}} (stuck) ||{{Fail}} test 148 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|-
|-
!04
!04
|serial_time_3
|serial_time_3
|
|
|Not Tested ||{{Fail}} test 145 ||{{Fail}} test 148 ||{{Fail}} test 250 ||{{Fail}} test 135 ||{{Fail}} (stuck) ||{{Fail}} test 150 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|{{Fail}} test 20 ||{{Fail}} test 145 ||{{Fail}} test 148 ||{{Fail}} test 250 ||{{Fail}} test 135 ||{{Fail}} (stuck) ||{{Fail}} test 150 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|-
|-
!05
!05
|serial_time_2M
|serial_time_2M
|
|
|Not Tested ||{{Fail}} test 207 ||{{Fail}} test 210 ||{{Fail}} test 247 ||{{Fail}} test 131 ||{{Fail}} (stuck) ||{{Fail}} test 210 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|{{Fail}} test 204 ||{{Fail}} test 207 ||{{Fail}} test 210 ||{{Fail}} test 247 ||{{Fail}} test 131 ||{{Fail}} (stuck) ||{{Fail}} test 210 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|-
|-
!06
!06
|serial_time_2M_2
|serial_time_2M_2
|
|
|Not Tested ||{{Fail}} test 208 ||{{Fail}} test 211 ||{{Fail}} test 247 ||{{Fail}} test 133 ||{{Fail}} (stuck) ||{{Fail}} test 212 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|{{Fail}} test 204 ||{{Fail}} test 208 ||{{Fail}} test 211 ||{{Fail}} test 247 ||{{Fail}} test 133 ||{{Fail}} (stuck) ||{{Fail}} test 212 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|-
|-
!07
!07
|serial_time_2M_3
|serial_time_2M_3
|
|
|Not Tested ||{{Fail}} test 209 ||{{Fail}} test 212 ||{{Fail}} test 250 ||{{Fail}} test 135 ||{{Fail}} (stuck) ||{{Fail}} test 214 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|{{Fail}} test 212 ||{{Fail}} test 209 ||{{Fail}} test 212 ||{{Fail}} test 250 ||{{Fail}} test 135 ||{{Fail}} (stuck) ||{{Fail}} test 214 ||{{Fail}} (stuck) ||Not Tested ||Not Tested
|-
|-
!08
!08
|serial_start_bit
|serial_start_bit
|
|
|Not Tested ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Pass}} ||{{Pass}} ||{{Fail}} test 1 ||{{Fail}} test 1 ||Not Tested ||Not Tested
|{{Fail}} test 1 ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Pass}} ||{{Pass}} ||{{Fail}} test 1 ||{{Fail}} test 1 ||Not Tested ||Not Tested
|-
|-
!09
!09
|serial_start_bit_2
|serial_start_bit_2
|
|
|Not Tested ||{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Pass}} ||{{Pass}} ||Not Tested ||Not Tested
|{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Pass}} ||{{Pass}} ||Not Tested ||Not Tested
|-
|-
!colspan="13"|STM
!colspan="13"|STM
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|data_swap
|data_swap
|
|
|Not Tested ||{{Fail}} test 456 ||{{Fail}} test 459 ||{{Fail}} (stuck) ||{{Fail}} test 454 ||{{Pass}} ||{{Fail}} (crash) ||{{Fail}} test 454 ||Not Tested ||Not Tested
|{{Pass}} ||{{Fail}} test 456 ||{{Fail}} test 459 ||{{Fail}} (stuck) ||{{Fail}} test 454 ||{{Pass}} ||{{Fail}} (crash) ||{{Fail}} test 454 ||Not Tested ||Not Tested
|-
|-
!04
!04
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|dma_repeat_immediate
|dma_repeat_immediate
|
|
|Not Tested ||{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Pass}} ||Not Tested ||Not Tested
|{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Pass}} ||{{Fail}} test 1 ||{{Fail}} test 1 ||{{Pass}} ||Not Tested ||Not Tested
|-
|-
!colspan="13"|Memory
!colspan="13"|Memory
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|memory
|memory
|
|
|Not Tested ||{{Fail}} test 100 ||{{Fail}} test 100 ||{{Fail}} test 100 ||{{Fail}} test 101 ||{{Fail}} test 114 ||{{Fail}} test 104 ||{{Fail}} test 100 ||Not Tested ||Not Tested
|{{Fail}} test 7 ||{{Fail}} test 100 ||{{Fail}} test 100 ||{{Fail}} test 100 ||{{Fail}} test 101 ||{{Fail}} test 114 ||{{Fail}} test 104 ||{{Fail}} test 100 ||Not Tested ||Not Tested
|-
|-
!colspan="13"|PSR
!colspan="13"|PSR
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|dma-latch<sup></sup>
|dma-latch<sup></sup>
|4
|4
|Not Tested ||{{Pass}} ||{{Fail}} (3) ||{{Pass}} ||{{Fail}} (2) ||{{Fail}} (3) ||{{Fail}} (0) ||{{Fail}} (0) ||Not Tested ||Not Tested
|{{Fail}} (3) ||{{Pass}} ||{{Fail}} (3) ||{{Pass}} ||{{Fail}} (2) ||{{Fail}} (3) ||{{Fail}} (0) ||{{Fail}} (0) ||Not Tested ||Not Tested
|-
|-
!03
!03
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